homepage  Research  Publications  before 2000
 
Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Journal of Infrared and Millimeter Waves 19(6), 463-466.
Date: 2011-08-15   Author: SKLFS  ,   Source: WOS  ,
 

Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Test and diagnosis of electric circuitry by IR thermal imaging. Journal of Infrared and Millimeter Waves 19(6), 463-466. [In Chinese]

Web link: Keywords:

electric circuitry, infrared thermal image, diagnosis, modeling,

Abstract: A model of IR thermal diagnosis for electric circuitry was established. The temperature profile on the circuitry surface was measured by a thermal video system. And then the inner metallic conductor's temperature was calculated through the developed model to find hidden troubles of malfunction and fire in early stage. A model simulating the different running conditions of the circuitry was also developed to extend the application scope.

 
Print    Close
 
 
   
  
 
Relevant link
Contact us
State Key Laboratory of Fire Science, University of Science and Technology of China
Jinzhai Road 96, Hefei, Anhui, P. R. China
P. O.: 230026
   
Tel:(+86)551 63601651
Fax:(+86)551 63601669
E-mail:sklfs@ustc.edu.cn
 
 
Copyright © 1990-2011 State Key Laboratory of Fire Science, University of Science and Technology of China
Tel:(+86)551 3601651 | Fax:(+86)551 3601669 | E-mail:sklfs@ustc.edu.cn | ICP: D20380176